Quiz — Lumerical FDTD — Monitors

In which of the following cases would you want to use an index monitor? (select all that apply) 

Which of the following are applications where the time monitor is suitable?

Play the following video showing the E-field intensity generated from a movie monitor with a diverging simulation. Note that the divergence starts in the second half of the video so you can skip forward without viewing the full video.

Select the statements that are true below:

Which of the following plots show results that can be obtained directly from a frequency domain power or profile monitor without post-processing? 

Select the statements that are true. 

The S-paramaters for a device can be exported to a .dat file which can be loaded in INTERCONNECT after the simulations have been run. You can do this by right-clicking on the ___________ and selecting "Export to INTERCONNECT". 

Which of the following material properties are measured by the index monitor? 

Which of the following monitors return data in the time domain? 

Which of the following monitors would be most appropriate for determining the resonant frequency of a cavity? 

Which of the following monitors would be most appropriate for obtaining the net power transmission through a surface? 

A single-mode expansion monitor can be used to calculate expansion results for multiple frequency domain monitors. 

Which of the following could potentially be used to extract S-parameters for a device? 

Download and run the associated script file to set up the simulation. This sets up a simulation with a coated particle made of several spheres on top of a silicon substrate. Symmetry is used in the simulation region boundaries to reduce memory requirements.

Verify structure using refractive index monitor

Add an index monitor over the cross-section of the spherical particle.

What is the structure of the particle?

Add a monitor above the source to measure the reflected power at 100 points over the frequency range of the source. Run the simulation and plot the reflection spectrum. 

What is the maximum fraction of power at reflected?

Insert your answer as a number with three decimal places precision. For example, if the answer is 0.254912, type in 0.254.

What wavelength does the maximum reflection occur at? Specify the answer in units of microns.

Insert your answer as a number with three decimal places precision. For example, if the answer is 0.254912, type in 0.254.

Download and run the associated script file to set up the simulation. This is a 2D simulation where the source injects light from the narrow waveguide towards the wider waveguide. A frequency-domain power monitor is placed across the cross-section of the wider waveguide to measure the power transmitted through the device. A time monitor is placed behind the source and will measure the reflected fields over time.

Add a mode expansion monitor to find the fraction of transmitted power in the fundamental TM and first-order TM modes, ie. the two modes with the highest effective index with TM polarization (E fields are polarized in the z-direction). Run the simulation.

What is the fraction of transmitted power travelling forward in the fundamental TM mode?

Insert your answer as a number with three decimal places precision. For example, if the answer is 0.254912, type in 0.254.

What is the fraction of transmitted power travelling forward in the first order TM mode? 

Insert your answer as a number with three decimal places precision. For example, if the answer is 0.254912, type in 0.254.

What is the total net power transmitted through the T monitor (transmission in all modes)?

Insert your answer as a number with three decimal places precision. For example, if the answer is 0.254912, type in 0.254.

What is the maximum E field amplitude at any point in time measured by the time monitor?

Insert your answer as a number with four decimal places precision. For example, if the answer is 0.254912, type in 0.2549.